SPIX: a new technique for quantitative surface spectroscopy applied to SInP(001)
Author/Authors :
L. Rodr?guez-Fern?ndez، نويسنده , , W.N. Lennard، نويسنده , , H. Xia، نويسنده , , G.R. Massoumi، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1996
Pages :
10
From page :
289
To page :
298
Abstract :
A new technique for quantitative surface spectroscopy is described using charged particle X-ray excitation. The method is applied to determine a saturation coverage of 1.2 ± 0.24 ML for sulphur-passivated InP(001).
