Image analysis of structural changes in laser irradiated thin films of photodeposited a-Se

Write and erase features by the photodeposition effect have been accomplished in recent investigations. Quantitative analysis of the surface grains size and structure in the laser affected areas of the deposited thin films is of importance to the understanding of the material surface redistribution phenomena. Fractal dimensionality and 2D-Fourier spectral analyses have been employed as the most straightforward quantitative approaches connecting the change of grain size distribution with the driving forces involved in the formation of the grain shapes. These approaches have been used since the irregular spatial shapes of the grains cannot be approximated by simple or regular geometrical shapes of definite size. Hence, we use these two topological analysis methods for classifying the surface morphology in the various zones of the laser beam written thin film.