Author/Authors :
A.G. Sivakov، نويسنده , , A.P. Zhuravel، نويسنده , , O.G. Turutanov، نويسنده , , I.M. Dmitrenko، نويسنده ,
Abstract :
The work describes the low temperature scanning laser microscopy technique used for spatially resolved characterization of superconducting films and film-based cryoelectronic circuits in the temperature range from 2 to 300 K. The determination of superconducting parameters for separate elements of a high Tc Josephson junctions array and imaging of the resistive transition in a high Tc superconducting polycrystalline film are demonstrated. The spatial evolution of the resistive state of a Sn thin film strip associated with the phase slip lines formation is visualized.
