Title of article :
Nanometer-scale passivation of Si(111) surfaces by using the √3 × √3-Ga reconstruction
Author/Authors :
K Fujita، نويسنده , , Y Kusumi، نويسنده , , M Ichikawa، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1996
Pages :
5
From page :
6
To page :
10
Abstract :
Si(111) surfaces with a nanometer-scale Si(111)-√3 × √3-Ga area have been observed by scanning tunneling microscopy after exposure of molecular oxygen at room temperature, in order to compare the chemical activities on Si(111)-7 × 7 and √3 × √3-Ga surfaces. After exposure to 10 L of oxygen, the 7 × 7 reconstruction around the √3 × √3-Ga area disappears, while the √3 × √3-Ga reconstruction remains due to the effect of surface passivation. The √3 × √3-Ga reconstruction is preserved after exposure to more than 20 L, though Ga atoms are oxidized from boundaries between the 7 × 7 surface and the √3 × √3-Ga area and surface defects in the √3 × √3-Ga.
Journal title :
Applied Surface Science
Serial Year :
1996
Journal title :
Applied Surface Science
Record number :
991220
Link To Document :
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