Title of article
Nanometer-scale characterization of surface materials by STM light emission spectroscopy
Author/Authors
Y. Uehara، نويسنده , , K. Ito، نويسنده , , S. Ushioda، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1996
Pages
8
From page
247
To page
254
Abstract
Three typical applications of the STM light emission spectroscopy in nanometer-scale characterization of surface materials are reviewed. When electrons (holes) are injected from the tip of a STM to a sample surface, visible light is emitted. Since the beam diameter of electrons from the STM tip is narrower than ∼ 1 nm and moreover the beam energy is very low, one can obtain the light emission spectra of individual nanometer-scale structures without modifying them. By correlating the spectra with the size and shape of the structure, materials information about nanometer-scale individual structures can be obtained.
Journal title
Applied Surface Science
Serial Year
1996
Journal title
Applied Surface Science
Record number
991257
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