Title of article :
Nanometer-scale characterization of surface materials by STM light emission spectroscopy
Author/Authors :
Y. Uehara، نويسنده , , K. Ito، نويسنده , , S. Ushioda، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1996
Pages :
8
From page :
247
To page :
254
Abstract :
Three typical applications of the STM light emission spectroscopy in nanometer-scale characterization of surface materials are reviewed. When electrons (holes) are injected from the tip of a STM to a sample surface, visible light is emitted. Since the beam diameter of electrons from the STM tip is narrower than ∼ 1 nm and moreover the beam energy is very low, one can obtain the light emission spectra of individual nanometer-scale structures without modifying them. By correlating the spectra with the size and shape of the structure, materials information about nanometer-scale individual structures can be obtained.
Journal title :
Applied Surface Science
Serial Year :
1996
Journal title :
Applied Surface Science
Record number :
991257
Link To Document :
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