• Title of article

    Nanometer-scale characterization of surface materials by STM light emission spectroscopy

  • Author/Authors

    Y. Uehara، نويسنده , , K. Ito، نويسنده , , S. Ushioda، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1996
  • Pages
    8
  • From page
    247
  • To page
    254
  • Abstract
    Three typical applications of the STM light emission spectroscopy in nanometer-scale characterization of surface materials are reviewed. When electrons (holes) are injected from the tip of a STM to a sample surface, visible light is emitted. Since the beam diameter of electrons from the STM tip is narrower than ∼ 1 nm and moreover the beam energy is very low, one can obtain the light emission spectra of individual nanometer-scale structures without modifying them. By correlating the spectra with the size and shape of the structure, materials information about nanometer-scale individual structures can be obtained.
  • Journal title
    Applied Surface Science
  • Serial Year
    1996
  • Journal title
    Applied Surface Science
  • Record number

    991257