Title of article
Raman characterization of Bi12SiO20 thin films obtained by pulsed laser deposition
Author/Authors
J.C. Alonso، نويسنده , , R. Diamant، نويسنده , , E. Haro-Poniatowski، نويسنده , , M. Fern?ndez-Guasti، نويسنده , , G. Mu?oz، نويسنده , , I. Camarillo، نويسنده , , M. Jouanne، نويسنده , , J.F. Morhange، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1997
Pages
3
From page
359
To page
361
Abstract
The synthesis by pulsed laser deposition and characterization by Raman spectroscopy of Bi12SiO20 thin films are presented. The Raman spectra of the thin films are close to their crystalline counterpart only in the presence of an oxygen flow during growth. In the absence of oxygen, the observed spectra are similar to that of pure bismuth material.
Journal title
Applied Surface Science
Serial Year
1997
Journal title
Applied Surface Science
Record number
991386
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