Title of article :
Raman characterization of Bi12SiO20 thin films obtained by pulsed laser deposition
Author/Authors :
J.C. Alonso، نويسنده , , R. Diamant، نويسنده , , E. Haro-Poniatowski، نويسنده , , M. Fern?ndez-Guasti، نويسنده , , G. Mu?oz، نويسنده , , I. Camarillo، نويسنده , , M. Jouanne، نويسنده , , J.F. Morhange، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1997
Pages :
3
From page :
359
To page :
361
Abstract :
The synthesis by pulsed laser deposition and characterization by Raman spectroscopy of Bi12SiO20 thin films are presented. The Raman spectra of the thin films are close to their crystalline counterpart only in the presence of an oxygen flow during growth. In the absence of oxygen, the observed spectra are similar to that of pure bismuth material.
Journal title :
Applied Surface Science
Serial Year :
1997
Journal title :
Applied Surface Science
Record number :
991386
Link To Document :
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