Title of article
Planarization of rough silicon surfaces by laser annealing
Author/Authors
Bosseboeuf، A. نويسنده , , J Boulmer، نويسنده , , D. Débarre، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1997
Pages
4
From page
473
To page
476
Abstract
Rough silicon (or silicon alloy) surfaces are sometimes obtained after epitaxy or processes for micromachining due to unusual experimental conditions imposed by external constraints. We show that excimer laser annealing has an efficient ability to reduce roughness to nm scale, providing the surface melts under laser irradiation. No large improvement is observed above the melting threshold and only few laser shots (<10) are often sufficient.
Journal title
Applied Surface Science
Serial Year
1997
Journal title
Applied Surface Science
Record number
991410
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