Title of article :
Planarization of rough silicon surfaces by laser annealing
Author/Authors :
Bosseboeuf، A. نويسنده , , J Boulmer، نويسنده , , D. Débarre، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1997
Pages :
4
From page :
473
To page :
476
Abstract :
Rough silicon (or silicon alloy) surfaces are sometimes obtained after epitaxy or processes for micromachining due to unusual experimental conditions imposed by external constraints. We show that excimer laser annealing has an efficient ability to reduce roughness to nm scale, providing the surface melts under laser irradiation. No large improvement is observed above the melting threshold and only few laser shots (<10) are often sufficient.
Journal title :
Applied Surface Science
Serial Year :
1997
Journal title :
Applied Surface Science
Record number :
991410
Link To Document :
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