Title of article
Dependence of electrical resistivity on surface topography of MBE-grown Pt film
Author/Authors
Kouichi Nishikawa، نويسنده , , Masahiko Yamamoto، نويسنده , , Toshiki Kingetsu، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1997
Pages
5
From page
412
To page
416
Abstract
Surface topography of MBE-grown Pt film was investigated with scanning tunneling microscopy. On the other hand, electrical resistivity of the Pt film in Pt/Cu/Si specimen was measured using a proposed analytical model. Comparing the electrical resistivity change with the surface topography change, dependence of electrical resistivity on surface topography was clearly demonstrated.
Journal title
Applied Surface Science
Serial Year
1997
Journal title
Applied Surface Science
Record number
991616
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