Title of article :
Etching and a disordered overlayer on the Ge 100/-S surface
Author/Authors :
M. Go¨thelid، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1997
Pages :
9
From page :
87
To page :
95
Abstract :
High resolution core level photoelectron spectroscopy PES.and scanning tunneling microscopy STM.have been used to study the adsorption and desorption of S on and off the Ge 100.surface. The previously proposed bridge adsorption site of S is consistent with our results at low coverage. At saturation the substrate contains several GeSx species, with xs0.5 to 4. Both photoemission and STM reveals a non-ideal surface, with a saturation coverage above one monolayer. Furthermore, S is found to etch the substrate. The reaction products forms a disordered overlayer on top of the interface. This overlayer is transparent in the filled state STM images
Journal title :
Applied Surface Science
Serial Year :
1997
Journal title :
Applied Surface Science
Record number :
991647
Link To Document :
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