Title of article :
An apparatus for high-resolution positron-annihilation induced Auger-electron spectroscopy using a time-of-flight technique
Author/Authors :
Toshiyuki Ohdaira، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1997
Pages :
4
From page :
177
To page :
180
Abstract :
An apparatus for high-resolution positron-annihilation induced Auger electron spectroscopy (PAES) has been constructed at the intense slow positron beam line of the Electrotechnical Laboratory. The system uses a short pulsed positron beam (∼ ns width) and the time-of-flight (TOF) method for the energy analysis of the Auger electrons. In order to improve the energy resolution, an electrically isolated flight-tube is installed between a sample and a detector, and the electrons are retarded by biasing the flight tube. This method makes it possible to measure high-resolution PAES spectra with high efficiency.
Keywords :
Surface , TOF , Graphite , Positron , Auger
Journal title :
Applied Surface Science
Serial Year :
1997
Journal title :
Applied Surface Science
Record number :
991720
Link To Document :
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