Title of article
Strain distribution around a NiSi,/Si interface measured by convergent beam electron diffraction
Author/Authors
Yutaka Wakayama * ، نويسنده , , Shun-ichiro Tanaka، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1997
Pages
4
From page
285
To page
288
Abstract
Yutaka Wakayama * , Shun-ichiro Tanaka
Keywords
Interface , CBED , islands , Nisi , Si , Strain
Journal title
Applied Surface Science
Serial Year
1997
Journal title
Applied Surface Science
Record number
991801
Link To Document