Title of article :
Electrical properties of ferroelectric BaMgF, films grown on
GaAs substrates using AlGaAs buffer layer
Author/Authors :
Tomoki Hayashi، نويسنده , , Makoto Yoshihara، نويسنده , , Syun-ichiro Ohmi، نويسنده , , Eisuke Tokumitsu * ، نويسنده , ,
Hiroshi Ishiwara، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1997
Abstract :
Ferroelectric BaMgF, films have been grown on GaAs substrates with and without an AlGaAs buffer layer for
metal-ferroelectric-semiconductor field effect transistor (MFSFET) applications. It is shown that the temperature range of
530-570°C is suitable to grow the (140)-oriented BaMgF, films on GaAs. Furthermore, it is demonstrated that the AlGaAs
buffer layer is effective to reduce the leakage current. Capacitance-voltage (C-V) characteristics of
Al/BaMgF,/AlGaAs/n-GaAs/n+-GaAs(100) structures show a hysteresis loop with a counterclockwise trace, demonstrating
the ferroelectric nature of the BaMgF, film. On the other hand, the BaMgF, film directly grown on GaAs substrates has
clockwise-hysteresis loops due to the charge injections. It is also shown that the remanent polarization estimated from the
polarization-electric field (P-E) characteristics is as large as 1.2 @/cm*.
Keywords :
nonvolatile memory , AlGaAs , Ferroelectrics , BaMgF , GaAs
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science