Preparation of PbZrxTi1 − xO3/La1 − xSrxCoO3 heterostructures using the sol-gel method and their electrical properties

PbZrxTi1 − xO3(PZT)/La1 − xSrxCoO3(LSCO) heterostructures were grown on MgO(100) substrates using the sol-gel technique and their structural and electrical properties were investigated. X-ray diffraction analysis showed that the PZT/LSCO film was polycrystalline with partial preferred (001)/(100) orientations. Fairly good ferroelectric properties of PZT were obtained when the PZT films were deposited on a well-crystallized LSCO film and were annealed at 700°C for 1 min. A typical value of the remnant polarization was 28 μC/cm2. It was also found that a longer annealing time enhanced the interdiffusion of constituent elements between LSCO and PZT. It is concluded from these results that in sol-gel processing, prevention of interdiffusion and crystallinity of the LSCO electrode film are two important factors for obtaining the desirable structural and electrical properties in this system.