Author/Authors :
K. Fujita *، نويسنده , , Kenji J. Tsuchiya، نويسنده , , S. Ichiki، نويسنده , , H. Hamamatsu، نويسنده , , N. Matsumoto، نويسنده , , M. Tabuchi، نويسنده , , Y. Fujiwara، نويسنده , , Y. Takeda، نويسنده ,
Abstract :
Atomic level hetero-structure analysis of Er S-doped InP grown by OMVPE was successfully made by the X-ray crystal
truncation rod (CTR) scattering measurement using synchrotron radiation. It was shown that Er atoms in the S-doped InP
formed rocksalt structure ErP. Distributions of the Er atoms around the S-doped layers were also revealed clearly on the
atomic scale. The total amounts of incorporated Er increased exponentially as the Er supply time increased
Keywords :
OMVPE , synchrotron radiation , InP , CTR , Er doping