• Title of article

    Atomic scale identification of the terminating structure of compound materials by CAICISS (coaxial impact collision ion scattering spectroscopy)

  • Author/Authors

    O. Ishiyama، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1997
  • Pages
    4
  • From page
    163
  • To page
    166
  • Abstract
    Quantitative surface analysis includes the determination of the elemental composition and the structure of the sample under investigation. Although LEED, XPS, and SPM etc. have been used to investigate the surface structure of the materials, ambiguity remains in determining quantitatively the topmost atomic species and its alignment on an atomic scale. Therefore, we adopted coaxial impact collision ion scattering spectroscopy (CAICISS) to identify the terminating structure of compound materials such as SrTiO3(001), InP(001) etc. As a result of the measurements, we could determine the topmost atomic plane of those materials. CAICISS is considered to be a powerful tool for those topmost surface analysis of the materials.
  • Keywords
    Coaxial impact collision ion scattering spectroscopy , Strontium titanate , Indium phosphide
  • Journal title
    Applied Surface Science
  • Serial Year
    1997
  • Journal title
    Applied Surface Science
  • Record number

    992013