• Title of article

    Structural determination for H2O adsorption on Si(001)2 × 1 using scanned-energy mode photoelectron diffraction

  • Author/Authors

    N. Franco، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1998
  • Pages
    4
  • From page
    219
  • To page
    222
  • Abstract
    Using scanned-energy-mode photoelectron diffraction we have determined the local adsorption geometry of the OH fragments adsorbed on Si(100)(2 × 1) surface. On this substrate water is known to adsorb dissociatively even at low temperature (90 K), which gives rise to a surface layer comprising coadsorbed OH and H species. The OH fragments are found to be adsorbed in off-atop sites at a dimerised surface Si atom with Osingle bondSi bond-lengths of 1.7 ± 0.1Å and bond-angles relative to the surface normal of 22 ± 5°.
  • Keywords
    Adsorption , Semiconductor surfaces , structure , Photoelectron diffraction
  • Journal title
    Applied Surface Science
  • Serial Year
    1998
  • Journal title
    Applied Surface Science
  • Record number

    992203