• Title of article

    LCAO calculations of sulphur interlayers on Ge(001) and Si(001)single bondK interfaces

  • Author/Authors

    Karl R. Whittle، نويسنده , , R. Saiz-Pardo، نويسنده , , F.J. Garc?a-Vidal، نويسنده , , F. Flores، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1998
  • Pages
    7
  • From page
    560
  • To page
    566
  • Abstract
    We present the results of an LD-LCAO (local-density linear-combination-of-atomic-orbitals) study on the effect of introducing an interlayer of S into Ksingle bondGe(001) and Si(001) interfaces. Total energy calculations of the Ge and Si interfaces, indicate that the S interlayer appears to chemically stabilise the interface, leading to a 1 × 1 S-interlayer on a bulk terminated semiconductor. Subsequent deposition of K produces a non-disruptive K monolayer in which the K atoms occupy a ‘bridge’ position (corresponding to that of a continued bulk structure). The DOS (density of states) of the K overlayer shows that the surface is metallic with the Fermi level pinned near the top of the Ge and Si band gaps.
  • Keywords
    LCAO , Si(001) , Ge(001) , Sulphur , Potassium , Interfaces , Passivation , Electronic structure , Surface , Interlayers
  • Journal title
    Applied Surface Science
  • Serial Year
    1998
  • Journal title
    Applied Surface Science
  • Record number

    992267