Title of article :
LCAO calculations of sulphur interlayers on Ge(001) and Si(001)single bondK interfaces
Author/Authors :
Karl R. Whittle، نويسنده , , R. Saiz-Pardo، نويسنده , , F.J. Garc?a-Vidal، نويسنده , , F. Flores، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1998
Pages :
7
From page :
560
To page :
566
Abstract :
We present the results of an LD-LCAO (local-density linear-combination-of-atomic-orbitals) study on the effect of introducing an interlayer of S into Ksingle bondGe(001) and Si(001) interfaces. Total energy calculations of the Ge and Si interfaces, indicate that the S interlayer appears to chemically stabilise the interface, leading to a 1 × 1 S-interlayer on a bulk terminated semiconductor. Subsequent deposition of K produces a non-disruptive K monolayer in which the K atoms occupy a ‘bridge’ position (corresponding to that of a continued bulk structure). The DOS (density of states) of the K overlayer shows that the surface is metallic with the Fermi level pinned near the top of the Ge and Si band gaps.
Keywords :
LCAO , Si(001) , Ge(001) , Sulphur , Potassium , Interfaces , Passivation , Electronic structure , Surface , Interlayers
Journal title :
Applied Surface Science
Serial Year :
1998
Journal title :
Applied Surface Science
Record number :
992267
Link To Document :
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