Title of article :
Carbon contamination free Ge(100) surface cleaning for MBE
Author/Authors :
H. Okumura، نويسنده , , T. Akane، نويسنده , , S. Matsumoto، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1998
Pages :
4
From page :
125
To page :
128
Abstract :
A carbon free wet treatment for Ge(100) surface has been proposed. This treatment consists of three steps: (1) several cycles of surface oxidation with H2O2 solution and the oxide etching with HCl solution, (2) the formation of protective oxide by NH4OH/H2O2/H2O treatment and (3) thermal desorption of the protective oxide in ultra high vacuum. An atomic force microscope image of the Ge(100) surface after step (1) indicates the surfaces is very smooth. After step (2), it is confirmed that the protective oxide contains no carbon contamination by Auger electron spectroscopy measurement. A reflection high energy electron diffraction pattern indicates that the surface, after step (3), has only atomic-scale steps.
Keywords :
MBE , Wet treatment , Ge , GeO2 , Surface cleaning
Journal title :
Applied Surface Science
Serial Year :
1998
Journal title :
Applied Surface Science
Record number :
992320
Link To Document :
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