Title of article :
Surface analysis of two misfit layer compounds — (PbS)1.18(TiS2) and (PbS)1.18(TiS2)2 — by scanning probe microscopies (AFM and STM) and X-ray photoelectron spectroscopy (XPS)
Author/Authors :
H. Martinez، نويسنده , , C. Auriel، نويسنده , , D. Gonbeau، نويسنده , , M. Loudet and D. Gonbeau، نويسنده , , G. Pfister-Guillouzo، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1998
Pages :
14
From page :
259
To page :
272
Abstract :
Scanning tunneling microscopy, atomic force microscopy and X-ray photoelectron spectroscopy were used to study the surface of two misfit layer compounds, (PbS)1.18(TiS2) and (PbS)1.18(TiS2)2. For the cleaved compounds, STM and AFM images in air and at room temperature revealed the trigonal symmetry of the transition metal dichalcogenide TiS2-1T. After a few hours of exposure to air, AFM and XPS show that the surfaces are strongly modified, with different features according to the mono or the bilayer misfit compounds considered. Depending on the time exposure to air, these results were interpreted in terms of hydrolysis and oxidation reactions.
Journal title :
Applied Surface Science
Serial Year :
1998
Journal title :
Applied Surface Science
Record number :
992338
Link To Document :
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