Title of article
Growth distinctions of GdBa Cu O films on 1012/sapphire
Author/Authors
M.R. Predtechensky، نويسنده , , O.M. Tukhto، نويسنده , , Yu.D. Varlamov، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1998
Pages
5
From page
136
To page
140
Abstract
The growth of epitaxial superconducting GdBa2Cu3O7yd films on 1012.sapphire without buffer layer.has been
investigated. The films have been grown in situ by pulsed laser deposition. The critical current density of 100-nm-thick films
was above 106Arcm2 77 K.and the surface resistance was 40 mV 77 K.at the frequency 75.2 GHz. The 300-nm-thick
films detached from the substrate have been investigated by high resolution electron microscopy. It has been shown that the
film consists of c-oriented single crystal grains about 0.5 mm in size. In the a,b plane each grain is oriented in one of the
two directions on the substrate surface along thew2021xorw0221xsapphire axes.. The differently oriented grains are
connected via small angle boundaries of 3–48. Such a film structure is caused by the lattice mismatch between
GdBa2Cu3O7yd and 1012.sapphire. With increasing film thickness above 120 nm, the development of cracks along the
small angle boundaries and degradation of superconducting properties takes place. q1998 Elsevier Science B.V.
Keywords
HTSC , thin films , epitaxy , Surface resistance
Journal title
Applied Surface Science
Serial Year
1998
Journal title
Applied Surface Science
Record number
992363
Link To Document