• Title of article

    Surface, interface and valence band structures of ultra-thin silicon oxides

  • Author/Authors

    Takeo Hattori، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1998
  • Pages
    9
  • From page
    156
  • To page
    164
  • Abstract
    The studies on surface, interface and valence band structures of ultra-thin silicon oxides at the initial stage of oxidation are reviewed. It will be shown that the surface and valence band structures of ultra-thin oxides are affected by the interface structures. q1998 Elsevier Science B.V. All rights reserved
  • Keywords
    Surface microroughness , Valence band discontinuity , XPS , AFM , Silicon oxide , Interface structure
  • Journal title
    Applied Surface Science
  • Serial Year
    1998
  • Journal title
    Applied Surface Science
  • Record number

    992594

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=992594