Title of article
Scanning tunneling microscopy/spectroscopy of dangling-bond wires fabricated on the Si(100)-2×1-H surface
Author/Authors
Taro Hitosugi، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1998
Pages
6
From page
340
To page
345
Abstract
We present a scanning tunneling microscopy/spectroscopy (STM/STS) study of atomic-scale dangling-bond (DB) wires on a hydrogen-terminated Si(100)-2×1-H surface. In the case of DB wires made of paired DBs, the STS shows semiconductive electronic states with a band gap of approximately 0.5 eV. The DB wires made of both single and paired DBs show a finite density of states at Fermi energy and do not show semiconductive band gaps. We have succeeded in making an atomic-scale wire that has a finite density of states at Fermi energy on a semiconductive surface. The results are in good agreement with a recent first-principles theoretical calculations.
Keywords
Scanning tunneling microscopy , Scanning tunneling spectroscopy , Silicon , Atomic wire , Dangling bond
Journal title
Applied Surface Science
Serial Year
1998
Journal title
Applied Surface Science
Record number
992625
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