Title of article
GaAs growth selectivity using a GaN mask by MOMBE
Author/Authors
Seikoh Yoshida، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1998
Pages
5
From page
414
To page
418
Abstract
We investigated the scattering adsorption and desorption.of trimethylgallium TMG. from GaN surfaces using a
pulsed-molecular beam in order to obtain information on the mechanism of growth suppression on the GaN mask during
selective area growth SAG.of GaAs. The GaN mask with the highest growth suppression was formed on a GaAs 100.
substrate using dimethylhydrazine DMHy.at a substrate temperature of 6408C. The time-of-arrival TOA.spectra of the
TMG reflected from the surface were measured using a cryoshrouded quadrupole mass spectrometer QMS.when pulsed
TMG beams were introduced to the surface. We observed that the TOA spectrum of TMG scattered from the GaN surface
had a long tail, corresponding to the surface residence of TMG during scattering. It is recognized that TMG desorbs on the
GaN surface without decomposition, although TMG was temporarily trapped in the precursor state. We consider that the
GaAs growth suppression on a GaN surface becomes higher when the surface structure is highly stabilized. q1998 Elsevier
Science B.V. All rights reserved.
Keywords
Quadrupole mass spectrometer QMS. , Time of arrival TOA. , GaAS , GaN , Growth selectivity , Reflection high-energy electron diffraction RHEED.
Journal title
Applied Surface Science
Serial Year
1998
Journal title
Applied Surface Science
Record number
992637
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