Title of article
Observation of SrTiO step edge dynamics by real-time 3 high-temperature STM
Author/Authors
M. Lippmaa، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1998
Pages
5
From page
582
To page
586
Abstract
We have used high-temperature scanning tunneling microscopy STM.to study in real time SrTiO3 step edge dynamics
in the 6008C to 8008C temperature range. We observed a dramatic transformation of the step edge structure above 6908C,
involving step edge straightening due to rapid migration of surface atoms. The STM study shows that if a NH4F-HF-etched
substrate is annealed at 8008C, a well-ordered surface, suitable for high-Tc superconductor thin film deposition, can be
produced. q1998 Elsevier Science B.V. All rights reserved
Keywords
Real-time high-temperature STM , Surface atoms , SrTiO3 step edge dynamics
Journal title
Applied Surface Science
Serial Year
1998
Journal title
Applied Surface Science
Record number
992667
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