Title of article :
Self-organization of nanoscale Ge islands in SirGerSi 113/ multilayers
Author/Authors :
Hiroo Omi )، نويسنده , , Toshio Ogino، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1998
Pages :
5
From page :
781
To page :
785
Abstract :
Multilayers of coherent Ge islands and Si spacer layers were grown on Si 113. substrate at 400 and 4508C by molecular-beam epitaxy. The islands grown on the substrates have a wire-like shape with 1594facets. The islands become more uniform as layer number increases when the growth temperature is 4008C. When the temperature is 4508C, the island shape changes from wire-like in the 1st Ge layer to dash-like in 6th Ge layer. The self-organized Ge islands are vertically aligned at both temperatures. The temperature-dependent self-organization can be explained by considering that the filtering effect acts one-dimensionally at 4008C and two-dimensionally at 4508C as predicted theoretically. q1998 Elsevier Science B.V. All rights reserved.
Keywords :
Stress induced self-organization , Ge , Si 113.substrate , SI , molecular-beam epitaxy
Journal title :
Applied Surface Science
Serial Year :
1998
Journal title :
Applied Surface Science
Record number :
992699
Link To Document :
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