Title of article
New development of a high-resolution scanning ESD system for two-dimensional images of hydrogen and its applications
Author/Authors
Kazuyuki Ueda، نويسنده , , Ken’ichi Ishikawa، نويسنده , , Masamichi Yoshimura، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1998
Pages
7
From page
815
To page
821
Abstract
Currently, many people have focused their study of hydrogen behaviors on solid surfaces because this plays an important
role in surface physics and chemistry. Hydrogen is detected easily by a time-of-flight type electron-stimulated desorption
spectroscopy TOF-ESD.. Very recently, we have developed way to measure a two-dimensional distribution of hydrogen
with high-resolution of less than 1 mm using a thermal field emission TFE.electron gun. The high detection efficiency of
the TOF-ESD system allows various ESD measurements including two-dimensional analysis. This method is complementary
to scanning Auger electron microscopy SAM., since SAM is insensitive to hydrogen but is able to analyze surface
concentration for most elements. In this article, we show some results obtained by our TOF-ESD system using a LEED gun
and a LaB6 gun and recent progress using a TFE gun. q1998 Elsevier Science B.V. All rights reserved
Keywords
Electron-stimulated desorption , time-of-flight mass spectroscopy , scanning probe microscopy , hydrogen
Journal title
Applied Surface Science
Serial Year
1998
Journal title
Applied Surface Science
Record number
992704
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