Title of article :
Interfacial profile of a Bragg Mirror
Author/Authors :
M.K. Sanyal، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1998
Abstract :
X-ray reflectivity and secondary ion mass spectrometry studies of a Bragg Mirror are presented. We find that the AlAs-on-AlGaAs interfaces are diffused due to formation of continuously varying composition of AlxGa1−xAs at the interfaces. On the other hand, the AlGaAs-on-AlAs interfaces are found to be sharp.
Keywords :
X-ray reflectivity , Secondary ion mass spectrometry , Semiconductor multilayers , Interdiffusion , Asymmetric interfaces
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science
