Title of article :
High-temperature oxidation of sintered silicon carbide under pure CO2 at low pressure: active–passive transition
Author/Authors :
M Balat، نويسنده , , R. Berjoan *، نويسنده , , G Pichelin، نويسنده , , D Rochman، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1998
Pages :
9
From page :
115
To page :
123
Abstract :
The study of the oxidation of SiC under CO2 at high temperature and low pressure is achieved by means of theoretical and experimental determinations of the transition zone between the passive oxidation with formation of a protective silica layer and the active oxidation with major vaporization of SiO and etching of the SiC material. The theoretical determination is done using both models: a computer model “Solgasmix”, applied for a closed system at equilibrium and the other, our analytical model, which takes into account the mass transfer at the solid/gas interface. The comparison is done for these two models and then with the experimental results. XPS analyses are performed on “passive” and “active” samples to confirm the position of the transition line. Moreover, SEM micrographs complete the diagnostics.
Keywords :
XPS , Silicon carbide , High temperature , Oxidation , Carbon dioxide , Active-to-passive transition
Journal title :
Applied Surface Science
Serial Year :
1998
Journal title :
Applied Surface Science
Record number :
992739
Link To Document :
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