Title of article
Determination of the position of V4+ as minor component in XPS spectra by difference spectra
Author/Authors
Yongsheng Chen، نويسنده , , Kan Xie، نويسنده , , Zhen Xiang Liu، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1998
Pages
4
From page
221
To page
224
Abstract
Difference spectra are used to determine the positions of minor components in XPS spectra without additional samples and without concerning the complication of the background. The requirements for obtaining accurate difference spectra are discussed. The displacement between V4+ 2p3/2, a minor component in V2O5 XPS spectra, and V5+ 2p3/2, is determined to be 2.0 eV.
Keywords
X-ray photoelectron spectroscopy (XPS) , Vanadium oxide
Journal title
Applied Surface Science
Serial Year
1998
Journal title
Applied Surface Science
Record number
992751
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