Title of article :
Auger electron spectroscopy of neutralized NH/S-passivated 4 2 InP 100/surfaces
Author/Authors :
Z.L. Yuan )، نويسنده , , J. B. Lai، نويسنده , , X.M. Ding، نويسنده , , X.Y. Hou، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1998
Pages :
4
From page :
69
To page :
72
Abstract :
Auger electron spectroscopy AES.is used to investigate the neutralized NH4.2S-treated InP 100.surfaces. AES data show that the sulfide layer formed is thicker than that formed by conventional NH4.2S alkaline solution. Its passivation mechanism is also discussed. q1998 Elsevier Science B.V. All rights reserved
Keywords :
Neutralized NH4.2S solution , Alkaline NH4.2S solution , Auger electron spectroscopy AES. , Sulfur passivation , InP
Journal title :
Applied Surface Science
Serial Year :
1998
Journal title :
Applied Surface Science
Record number :
992768
Link To Document :
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