Title of article
Ultrathin Au layers on Si 100/: surface silicide formation at room temperature
Author/Authors
W.C.A.N. Ceelen، نويسنده , , B. Moest، نويسنده , , M. de Ridder، نويسنده , , L.J. van IJzendoorn، نويسنده , , A.W. Denier van der Gon، نويسنده , , H.H Brongersma، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1998
Pages
8
From page
87
To page
94
Abstract
The deposition at room temperature of Au films on Si 100. has been studied by a combination of techniques for
thicknesses up to 10 monolayers. From low-energy ion scattering LEIS. and Auger electron spectroscopy AES.
measurements, it is derived that the outermost layer consists of a mixture of Au and Si for the whole coverage range. The
critical coverage to induce intermixing is determined to be at most 0.25 monolayer ML., but the measurements are also
consistent with an immediate onset of intermixing. The surface silicide has a disordered character as shown by spot-profile
analysis low-energy electron diffraction SPA-LEED.. Using this technique it is also concluded that the interface between
the surface silicide and the substrate is essentially identical to the morphology of the Si 100.surface before deposition.
q1998 Elsevier Science B.V. All rights reserved
Keywords
AU , Si , Low-energy ion scattering LEIS. , Spot profile analysis low-energy electron diffraction SPA-LEED , silicide
Journal title
Applied Surface Science
Serial Year
1998
Journal title
Applied Surface Science
Record number
992771
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