Core and valence level characterization of the interfacial reaction between partially oxidized Ti films and graphite

The solid state reaction between partially oxidized Ti films and highly oriented pyrolitic graphite HOPG.was studied by soft X-ray photoelectron spectroscopy PES.. The reaction readily occurs upon room-temperature deposition, and is apparently catalyzed by the presence of oxide species. The interfacial reaction is also characterized by its influence on the surface electronic structure of HOPG through modification of the C 1s core-hole screening process. The characteristics of the electronic structures of the films and the interface are described by analysis of the valence band photoemission spectra. An electron-transfer model, previously suggested by the other workers, may be used to describe this catalytical reaction. q1999 Published by Elsevier Science B.V.