Title of article :
Investigations of C molecules deposited on Si 111/by 60
noncontact atomic force microscopy
Author/Authors :
Kei Kobayashi، نويسنده , , Hirofumi Yamada، نويسنده , , Toshihisa Horiuchi، نويسنده , , Kazumi Matsushige، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Abstract :
We demonstrated the high resolution imaging of the organic molecules using noncontact atomic force microscopy in
ultrahigh vacuum. The sample was C60 molecules deposited on the Si 111.-7=7 reconstructed surface. When the thickness
of the C60 film was submonolayer, we could image some isolated C60 molecules and the reconstructed Si surface
simultaneously. However, the imaging was highly unstable not only because of the large structure but also due to the large
difference between the interaction forces on the molecules and on the Si surface. On the other hand, when the thickness of
the C60 molecules was almost monolayer, individual molecules could be stably imaged. q1999 Published by Elsevier
Science B.V. All rights reserved
Keywords :
Fullerene , Atomic force microscopy , Organic molecules
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science