Abstract :
We have analyzed the possibility of using noncontact scanning force microscopy NCAFM.to detect variations in
surface composition, i.e., to detect a ‘spectroscopic image’ of the sample. This ability stems from the fact that the long-range
forces, acting between the AFM tip and sample, depend on the composition of the AFM tip and sample. The long-range
force can be magnetic, electrostatic, or van der Waals forces. Detection of the first two forces is presently used in scanning
force microscopy technique, but van der Waals forces have not been used. We demonstrate that the recovery of
spectroscopic image has a unique solution. Furthermore, the spectroscopic resolution can be as good as lateral one. q1999
Elsevier Science B.V. All rights reserved.
