• Title of article

    Quantification of polystyrene blend surfaces based on end group ToF-SIMS analysis 1

  • Author/Authors

    X. Vanden Eynde )، نويسنده , , P. Bertrand، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1999
  • Pages
    20
  • From page
    1
  • To page
    20
  • Abstract
    In this work, two sets of low molecular weight polystyrene blends were studied. The first one is composed of two polystyrenes with, at one end, tertiary or secondary butyl end group sec- and tert-.and hydrogen end group –H. at the other end. ToF-SIMS spectra show a linear dependency with bulk concentration. Due to the slight difference of molecular structures between sec- and tert-butyl end group, no difference of surface free energy and surface state is expected. Then, the observed linear dependency implies that the matrix effect is insignificant. The second set of polymer blends are composed of polystyrenes with, at one end, tertiary or secondary butyl end group sec- or tert-.and at the other end, hydrogen –H.or trimethyl silyl –Si CH3.3, TMS.end group, respectively. With the results from the first set of blends, we were able to quantify the sec-PS–Si concentration at the surface as compared to the bulk, using univariate and multivariate techniques. The different methods establish that all these polystyrene blends present a bulk-like surface. The principal component analysis PCA.seems to be interesting for the study of ternary polymer blends. q1999 Elsevier Science B.V. All rights reserved.
  • Keywords
    Polystyrene blends , End group , Secondary ion mass spectrometry , Polymer film , Quantification
  • Journal title
    Applied Surface Science
  • Serial Year
    1999
  • Journal title
    Applied Surface Science
  • Record number

    995213