Title of article :
Quantification of polystyrene blend surfaces based on end group ToF-SIMS analysis 1
Author/Authors :
X. Vanden Eynde )، نويسنده , , P. Bertrand، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Pages :
20
From page :
1
To page :
20
Abstract :
In this work, two sets of low molecular weight polystyrene blends were studied. The first one is composed of two polystyrenes with, at one end, tertiary or secondary butyl end group sec- and tert-.and hydrogen end group –H. at the other end. ToF-SIMS spectra show a linear dependency with bulk concentration. Due to the slight difference of molecular structures between sec- and tert-butyl end group, no difference of surface free energy and surface state is expected. Then, the observed linear dependency implies that the matrix effect is insignificant. The second set of polymer blends are composed of polystyrenes with, at one end, tertiary or secondary butyl end group sec- or tert-.and at the other end, hydrogen –H.or trimethyl silyl –Si CH3.3, TMS.end group, respectively. With the results from the first set of blends, we were able to quantify the sec-PS–Si concentration at the surface as compared to the bulk, using univariate and multivariate techniques. The different methods establish that all these polystyrene blends present a bulk-like surface. The principal component analysis PCA.seems to be interesting for the study of ternary polymer blends. q1999 Elsevier Science B.V. All rights reserved.
Keywords :
Polystyrene blends , End group , Secondary ion mass spectrometry , Polymer film , Quantification
Journal title :
Applied Surface Science
Serial Year :
1999
Journal title :
Applied Surface Science
Record number :
995213
Link To Document :
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