• Title of article

    A SIMS and XPS study about ions influence on electrodeposited PbO films

  • Author/Authors

    R. Amadelli، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1999
  • Pages
    4
  • From page
    200
  • To page
    203
  • Abstract
    XPS and SIMS investigation is presented on doped PbO2 electrodeposited on Ti under conditions in which the beta form of the oxide largely prevails. Complementary results obtained by XPS and SIMS analyses indicate that the doping species markedly affect the oxygen species accumulation on the oxide surface. In particular, metal cations added to electrodeposition bath are found to influence the Fy incorporation in the surface region of PbO2 even if these foreign species are not detected in the coatings. q1999 Published by Elsevier Science B.V. All rights reserved.
  • Keywords
    Lead dioxide , Fluoride , SIMS , XPS , Surface analysis
  • Journal title
    Applied Surface Science
  • Serial Year
    1999
  • Journal title
    Applied Surface Science
  • Record number

    995292