Title of article :
Method for determining the signal linearity in single and
multidetector counting systems in X-ray photoelectron
spectroscopy
Author/Authors :
M.P. Seah، نويسنده , , I.S. Gilmore، نويسنده , , S.J. Spencer، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Abstract :
Both predictable and unpredictable non-linearities occur in the electron counting systems which provide the intensity
scales of different X-ray photoelectron spectrometers. The predictable effects are inherent in good system design and may be
accurately corrected as they are both stable and repeatable. Unpredictable effects occur due to inadequate design,
deterioration in service or poor setting-up procedures. We have therefore, devised a method to measure this non-linearity in
X-ray photoelectron spectroscopy XPS.. A widescan survey.spectrum is recorded from a copper or stainless steel sample
at both high and low X-ray source emission currents. The ratio of these spectra, at each emission energy, allows
non-linearities to be easily measured. We show results for one example of a predictable system exhibiting only dead time
effects which can be corrected to give 1% accuracy up to 5 Mcrs. We also show results for an unpredictable multichannel
detector system where the non-linearity exceeds 5% at counting rates below 20 kcrs and reaches 50% at 500 kcrs. Crown
Copyright q1999 Published by Elsevier Science B.V.
Keywords :
Linearity , Quantification , XPS , Intensity linearity , detectors
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science