Title of article :
Method for determining the signal linearity in single and multidetector counting systems in X-ray photoelectron spectroscopy
Author/Authors :
M.P. Seah، نويسنده , , I.S. Gilmore، نويسنده , , S.J. Spencer، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Pages :
5
From page :
132
To page :
136
Abstract :
Both predictable and unpredictable non-linearities occur in the electron counting systems which provide the intensity scales of different X-ray photoelectron spectrometers. The predictable effects are inherent in good system design and may be accurately corrected as they are both stable and repeatable. Unpredictable effects occur due to inadequate design, deterioration in service or poor setting-up procedures. We have therefore, devised a method to measure this non-linearity in X-ray photoelectron spectroscopy XPS.. A widescan survey.spectrum is recorded from a copper or stainless steel sample at both high and low X-ray source emission currents. The ratio of these spectra, at each emission energy, allows non-linearities to be easily measured. We show results for one example of a predictable system exhibiting only dead time effects which can be corrected to give 1% accuracy up to 5 Mcrs. We also show results for an unpredictable multichannel detector system where the non-linearity exceeds 5% at counting rates below 20 kcrs and reaches 50% at 500 kcrs. Crown Copyright q1999 Published by Elsevier Science B.V.
Keywords :
Linearity , Quantification , XPS , Intensity linearity , detectors
Journal title :
Applied Surface Science
Serial Year :
1999
Journal title :
Applied Surface Science
Record number :
995447
Link To Document :
بازگشت