• Title of article

    Investigation of acceptors in p-type WS by standard and 2 photo-assisted scanning tunneling microscopyrspectroscopy

  • Author/Authors

    Ch. Sommerhalter، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1999
  • Pages
    6
  • From page
    564
  • To page
    569
  • Abstract
    Current imaging tunneling spectroscopy CITS.and photo-assisted scanning tunneling spectroscopy STS.is used to characterize dopants in p-type WS2 single crystals. While the local charge distribution at ionized acceptor sites give rise to topographic depressions on a nm scale, CITS measurements reveal an additional bright ring. On the base of a one dimensional metal–insulator–semiconductor MIS.model, the topographic contrast and the ring structure are explained by two competing current mechanisms involving tunneling into unoccupied states of the valence and the conduction band. Local surface photovoltage LSPV.imaging allows to directly measure the local potential. We observe a nonoscillating reduction of the tip-induced bandbending in the vicinity of the acceptors and correlate this with the lateral extension of the topographic depressions and the ring structures observed in CITS measurements. In addition, photoinduced tunneling current PITC. measurements do not show an enhanced minority charge carrier recombination at acceptor sites. q1999 Elsevier Science B.V. All rights reserved
  • Keywords
    Scanning tunneling microscopy , Scanning tunneling spectroscopy , Doping , Photovoltaic effect , Transitionmetal dichalcogenides , semiconductors
  • Journal title
    Applied Surface Science
  • Serial Year
    1999
  • Journal title
    Applied Surface Science
  • Record number

    995531