Title of article
Probing the organization of adsorbed protein layers: complementarity of atomic force microscopy, X-ray photoelectron spectroscopy and radiolabeling
Author/Authors
Yves F. Dufreˆne )، نويسنده , , Thibault G. Marchal، نويسنده , , Paul G. Rouxhet، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
6
From page
638
To page
643
Abstract
Atomic force microscopy AFM.has been used to investigate the organization of the collagen layer present on polymer
substrata after adsorption and drying, while the adsorbed amount was monitored using X-ray photoelectron spectroscopy
XPS.and radiochemical measurements. Differences in the organization of the adsorbed collagen layer surface coverage,
layer thickness. observed by AFM fitted well with those found by models obtained from XPS and radiolabeling data. q1999
Elsevier Science B.V. All rights reserved
Keywords
atomic force microscopy , Adsorbed protein layers , X-ray photoelectron spectroscopy , Radiolabeling
Journal title
Applied Surface Science
Serial Year
1999
Journal title
Applied Surface Science
Record number
995546
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