• Title of article

    Probing the organization of adsorbed protein layers: complementarity of atomic force microscopy, X-ray photoelectron spectroscopy and radiolabeling

  • Author/Authors

    Yves F. Dufreˆne )، نويسنده , , Thibault G. Marchal، نويسنده , , Paul G. Rouxhet، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1999
  • Pages
    6
  • From page
    638
  • To page
    643
  • Abstract
    Atomic force microscopy AFM.has been used to investigate the organization of the collagen layer present on polymer substrata after adsorption and drying, while the adsorbed amount was monitored using X-ray photoelectron spectroscopy XPS.and radiochemical measurements. Differences in the organization of the adsorbed collagen layer surface coverage, layer thickness. observed by AFM fitted well with those found by models obtained from XPS and radiolabeling data. q1999 Elsevier Science B.V. All rights reserved
  • Keywords
    atomic force microscopy , Adsorbed protein layers , X-ray photoelectron spectroscopy , Radiolabeling
  • Journal title
    Applied Surface Science
  • Serial Year
    1999
  • Journal title
    Applied Surface Science
  • Record number

    995546