Studies of full color field emission display core technologies with the electrical and structural analysis

Electron beam spreading and its relationship with layout of field emission display FED.is simulated and discussed. The morphological optimization of microtips is introduced for the effect of field enhancement with the process condition. The structural effect of thin film step coverage which is formed during the fabrication of field emitter arrays FEAs.is uniquely studied with the reliability of FED. The surface condition of phosphor and its relationship with the brightness enhancement are analyzed and studied with the specific aging step. A unique approach of gas aging for the image stabilization is introduced and fully analyzed. q1999 Elsevier Science B.V. All rights reserved