Abstract :
This work focuses on the use and control of excimer lasers KrF, ls248 nm and XeCl, ls308 nm.for the removal of
encrustation black crusts, soil-dust and biological deposits.from Pentelic marble. A number of surface analytical
techniques, such as Fourier transform infrared spectroscopy FTIR., scanning electron microscopy SEM.interfaced with
microprobe analysis energy dispersive X-ray analysis: EDX., X-ray diffraction XRD., laser-induced breakdown spec-
troscopy LIBS.and optical microscopy OM.were used to detect chemical composition and crust morphology, as well as to
monitor the effects induced by the laser treatment. SEM and OM providing structural information about the layers of
encrustation, LIBS and SEM–EDX providing information on the elemental composition of the ablated material, XRD and
FTIR detecting the changes of minerals appear to be particularly effective in assessing the quality of cleaning process. FTIR
and XRD showed removal of pollutants from encrustation and partial transformation of calcium sulfate dihydrate gypsum.
to hemihydrate and anhydrite, which have lower specific surface than gypsum. Irradiation conditions creating minimal
damaging effects were defined before treatment through surface analysis, ablation rate studies and optimization of laser
parameters. On the basis of structural and analytical examinations, both lasers are shown to be appropriate for achieving
sufficient removal of unwanted selected layers without modifying the surface morphology and surpassing by far the
effectiveness afforded by traditional cleaning techniques. q1999 Elsevier Science B.V. All rights reserved
Keywords :
Pollution layers , Marble encrustation , Irradiation effects , Surface analytical techniques , UV–laser ablation