Title of article :
Analysis of the electronic structure of hydrogenated amorphous
carbon via Auger spectroscopy
Author/Authors :
J.C. Lascovich، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Abstract :
The X-ray excited Auger electron spectroscopy XAES.has been used to investigate the pp electronic structure of
hydrogenated amorphous carbon a-C:H.films, at different hydrogen content. The X-ray Photoelectron Spectra XPS.of the
C1s core level with the associated photoelectron energy loss spectrum PELS.have been recorded simultaneously to the
XAES data. It has been proved that the double-differentiated ppUpp Auger self-fold contribution to the CKVV Auger
spectrum is very sensitive to the hydrogen content andror sample preparation conditions, providing a reliable fingerprint of
the material. The extent of the electronic gap and the fraction of sp2 sites of the a-C:H films have been estimated. The
features of the Auger ppUpp self-fold structure can be associated to those appearing in the electronic density of states
evaluated using Molecular Dynamics simulations. q1999 Elsevier Science B.V. All rights reserved
Keywords :
Hydrogenated amorphous carbon , Auger spectroscopy
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science