• Title of article

    Photoemission study of monolayer Co on Si 111/ surface

  • Author/Authors

    Bongsoo Kim )، نويسنده , , K.J. Kim، نويسنده , , T.-H. Kang، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1999
  • Pages
    5
  • From page
    44
  • To page
    48
  • Abstract
    The interaction of monolayer Co with the Si 111. surface is investigated by means of core-level and valence-band photoemission spectroscopy in the range of room temperature to 7008C. Upon increasing the annealing temperature, several formations of silicides are observed. This ultra-thin layer upon annealing at 300–4008C has electronic structure closely related to the metastable CsCl-type CoSi which was discovered by molecular beam epitaxy MBE.grown onto the CoSi2 template to a thickness of ;100 A° . Further annealing up to 5008C leads to the «-CoSi-type electronic structure. Finally, the formation of CaF2-type CoSi2is observed after annealing above 6008C. They lead also to an island formation above 7008C. q1999 Elsevier Science B.V. All rights reserved.
  • Keywords
    Co silicides , Metal–semiconductor interfaces , Photoemission , epitaxy
  • Journal title
    Applied Surface Science
  • Serial Year
    1999
  • Journal title
    Applied Surface Science
  • Record number

    995825