Electron-difraction investigation of HgCdTe laser deposited films

The investigation of pulsed laser deposited PLD.HgCdTe films structures by means of electron diffraction and transmission electron microscopy TEM.techniques was carried out. The deposition was made on GaAs, KCl, CdTe and sapphire substrates with YAG:Nd3q 1.06 mm.and XeCl 0.308 mm.lasers. The substrate temperature was in the range 308C–2508C. Both amorphous and polycrystalline films with different crystallite sizes were manufactured on substrates of different quality. The crystallite size versus film production conditions was evaluated from TEM studies. q2000 Elsevier Science B.V. All rights reserved.