Atomic resolved imaging of cleaved NiO 100/ surfaces by NC-AFM

We have observed the cleaved NiO 100.surface by means of the UHV non-contact atomic force microscopy NC-AFM.. Atomically resolved NC-AFM images of NiO 100.-cleaved surface has successfully obtained with atomically distinguish- able defects at room temperature. The distance of the observed periodic protrusions is about 4.2 A° and the periodicity corresponds to that of sublattice of NiO single crystal. q2000 Published by Elsevier Science B.V. All rights reserved.