Title of article :
Normal and lateral force investigation using magnetically activated force sensors
Author/Authors :
S.P. Jarvis، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
6
From page :
314
To page :
319
Abstract :
A new design of cantilever has been fabricated in order to easily apply the resonance dynamic measurement technique to lateral interactions between an atomic force microscope tip and sample. Simultaneous images have been obtained in ultrahigh vacuum UHV.for normal and lateral interactions by activating the cantilever independently at its normal and lateral resonant frequency. The distance dependence of the normal and lateral tip–sample interactions have also been investigated. q2000 Elsevier Science B.V. All rights reserved.
Keywords :
force spectroscopy , Dynamic lateral force microscopy , Magnetic force control , Tip–surface interaction
Journal title :
Applied Surface Science
Serial Year :
2000
Journal title :
Applied Surface Science
Record number :
996072
Link To Document :
بازگشت