Title of article :
Normal and lateral force investigation using magnetically
activated force sensors
Author/Authors :
S.P. Jarvis، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Abstract :
A new design of cantilever has been fabricated in order to easily apply the resonance dynamic measurement technique to
lateral interactions between an atomic force microscope tip and sample. Simultaneous images have been obtained in
ultrahigh vacuum UHV.for normal and lateral interactions by activating the cantilever independently at its normal and
lateral resonant frequency. The distance dependence of the normal and lateral tip–sample interactions have also been
investigated. q2000 Elsevier Science B.V. All rights reserved.
Keywords :
force spectroscopy , Dynamic lateral force microscopy , Magnetic force control , Tip–surface interaction
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science