Title of article :
Characterization of low dielectric constant amorphous carbon nitride films
Author/Authors :
M. Aono)، نويسنده , , S. Nitta، نويسنده , , T. Katsuno، نويسنده , , T. ITOH، نويسنده , , S. Nonomura، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
4
From page :
341
To page :
344
Abstract :
Amorphous carbon nitride a-CN.films have rather high resistivity and low dielectric constants that could be applied as x low dielectric constant materials. Several properties of a-CN films including interactions with metal electrodes are studied x and discussed using data from the frequency dependence of capacitance, Raman and photoluminescence spectra. q2000 Elsevier Science B.V. All rights reserved.
Keywords :
amorphous , Carbon-nitride film , Raman spectra , aluminum , Low dielectric constant , Reaction with metal
Journal title :
Applied Surface Science
Serial Year :
2000
Journal title :
Applied Surface Science
Record number :
996192
Link To Document :
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