• Title of article

    Determination of grain-boundary diffusion coefficients by Auger electron spectroscopy

  • Author/Authors

    Z. Erde´lyi، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2000
  • Pages
    6
  • From page
    213
  • To page
    218
  • Abstract
    Surface accumulation method, called the Hwang–Balluffi method wJ.C.M. Hwang, J.D. Pan and R.W. Balluffi, J. Appl. Phys., 50 3., 1979, 1339x, was applied to measure the grain-boundary diffusion of Ag at low temperatures 413 and 428 K. in a nanocrystalline Cu film. Ag atoms from the Ag layer diffused through the copper nanocrystalline film along the grain boundaries to the opposite surface i.e. the accumulation surface.where they spread out by rapid surface diffusion and accumulated. The rate of accumulation was detected by Auger Electron Spectroscopy AES.. It was shown that the results are not sensitive to the supposition whether accumulation takes place in one or two monolayers of the surface. TEM observations have been made in the same time before and after heat treatment to check the stability of the nanostructure. q2000 Elsevier Science B.V. All rights reserved.
  • Keywords
    Hwang–Balluffi method , Grain-boundary , AES , Diffusion coefficient
  • Journal title
    Applied Surface Science
  • Serial Year
    2000
  • Journal title
    Applied Surface Science
  • Record number

    996324