Abstract :
Fe has been sequentially deposited under ultra-high vacuum, from less than 1 ML up to over 120 ML 1 ML refers to the
GaSe surface, f8=1014 atomsrcm2., onto the clean 001. passive face of a 10-nm thick f12 layers. GaSe film
epitaxially grown by MBE onto a Si 111.1=1-H substrate and kept at room temperature. From low-energy electron
diffraction LEED., Auger electron spectroscopy AES.and photoemission yield spectroscopy PYS.measurements, a
model in which Fe atoms intercalate into the layered semiconductor at room temperature is proposed. It assumes the
formation of a ternary compound, which maintains the GaSe surface structure until saturation of the whole layered film by
intercalated Fe, which would involve two Fe monolayers per pseudo-van der Waals gap. q2000 Elsevier Science B.V. All
rights reserved.
Keywords :
Metal–semiconductor interfaces , Layered compound , intercalation , Iron on gallium selenide