Title of article :
Study of Fe deposition upon a layered compound: GaSe
Author/Authors :
M. Zerrouki، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
6
From page :
143
To page :
148
Abstract :
Fe has been sequentially deposited under ultra-high vacuum, from less than 1 ML up to over 120 ML 1 ML refers to the GaSe surface, f8=1014 atomsrcm2., onto the clean 001. passive face of a 10-nm thick f12 layers. GaSe film epitaxially grown by MBE onto a Si 111.1=1-H substrate and kept at room temperature. From low-energy electron diffraction LEED., Auger electron spectroscopy AES.and photoemission yield spectroscopy PYS.measurements, a model in which Fe atoms intercalate into the layered semiconductor at room temperature is proposed. It assumes the formation of a ternary compound, which maintains the GaSe surface structure until saturation of the whole layered film by intercalated Fe, which would involve two Fe monolayers per pseudo-van der Waals gap. q2000 Elsevier Science B.V. All rights reserved.
Keywords :
Metal–semiconductor interfaces , Layered compound , intercalation , Iron on gallium selenide
Journal title :
Applied Surface Science
Serial Year :
2000
Journal title :
Applied Surface Science
Record number :
996497
Link To Document :
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