Title of article :
Raman and photoluminescence spectroscopy from as grown and
147 keV Arq-ion implanted Al Ga AsrGaAs quantum wells
Author/Authors :
H.W. Kunert، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Abstract :
The AL Ga AsrGaAs quantum wells QWS.were subjected to 147 keV Arq-ion bombardment. The response of the x 1yx
QWS was studied by means of the secondary ion mass spectroscopy SIMS., low temperature photoluminescence LTPL.
and the inelastic light scattering spectroscopy. The damage accumulation in the QWS leads to a shift of quasiparticle energy
levels towards lower energies in QWS and to a decrease of LO1and LO2frequency modes of the ALxGa1yx As slabs. No
good recovery has been found after annealing. q2000 Elsevier Science B.V. All rights reserved.
Keywords :
Arq-ion , GaAs quantum wells , Photoluminescence and Raman spectroscopy
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science